The Intelligent Electromagnetic Sensor Laboratories (iEMSL) at Texas A&M University provides S-parameter testing, RF on-wafer probing and system-level testing for industry and academic clients. Measurements run from 300 kHz to 115 GHz with published per-device pricing, and frequency extenders reach 170 GHz on request. Standard turnaround is 5 business days.
Devices we characterize:
- Passive components: attenuators, capacitors, couplers, diplexers, duplexers, filters, inductors, splitters, transformers, cables and interconnects
- Active devices: amplifiers and mixers
- Semiconductor devices: BJT/HBT, NPN BJT, CMOS, GaAs HEMT, GaN HEMT, HEMT, JFET, MESFET, MOSFET/LDMOS, PIN diodes, step recovery diodes and varactors
S-Parameter Testing and Measurement
The Intelligent Electromagnetic Sensor Laboratories (iEMSL) at Texas A&M University offers high-precision S-parameter measurements to characterize the performance of RF, microwave, and millimeter-wave components and systems. Using vector network analyzers (VNAs), our services cover frequencies from 300 kHz to 115 GHz, providing critical data for research and industry applications.
- Comprehensive S-Parameter Analysis: Accurate measurement for passive and active components, including power calibration and P1dB measurement for nonlinear performance evaluation.
- Multi-Port Configurations: Support for complex setups up to 4-ports to evaluate multi-port devices and interconnects with high accuracy.
- Custom Test Protocols: Tailored measurement setups to meet specific project requirements, ensuring precise characterization for unique designs.
- Detailed Reporting: Touchstone files and spreadsheets with scattering parameter data, delivered in formats suitable for design validation and optimization.
The pricing details provided below correspond to the cost per experiment or per Touchstone file, offering clear and adaptable options tailored to your testing requirements. Please note that setup fees may be applicable for advanced configurations, as well as for power calibration and measurements involving 3- or 4-port setups.
| Frequency Range | Price/device | |
|---|---|---|
| Keysight P9370A Network Analyzer | 300 kHz to 4.5 GHz | $150 |
| Keysight N5242B PNA-X Network Analyzer | 10 MHz to 26.5 GHz | $250 |
| Rohde & Schwarz ZVA67 Vector Network Analyzer | 10 MHz to 67 GHz | $350 |
| VNA + VDI-VNAX WR10+extenders | 67 to 115 GHz | $700 |
Note: Texas A&M researchers receive a 50% reduction on the listed prices.
RF On-Wafer and Micro-Probing
Our Cascade Microtech M150 and FormFactor EPS150MMW probing stations enable RF on-wafer and micro-probing measurements for a wide range of components, including filters, amplifiers, mixers, and integrated circuits. These capabilities ensure reliable performance evaluation for high-frequency electronics.
- High-Resolution Probing: Probing stations for RF and microwave measurements on wafers, dies, and microelectronic components.
- Custom Probing Solutions: Flexible setups to accommodate unique device geometries, ensuring accurate characterization for specialized applications.
- High-Frequency Precision: Probing capabilities up to mm-Wave frequencies, for semiconductor and RF component testing.
- Frequency extenders: VDI WR10-VNAX (67 – 115GHz) and VDI WR6.5-VNAX (110 – 170GHz)
Our probing services support researchers and engineers in validating component performance, from initial design to final integration.
System-Level Testing
iEMSL provides comprehensive system-level testing for complete systems in communications, radar, and wireless applications. Conducted in our Metrology labs, our services include noise figure (NF) measurements to optimize system performance.
- Noise Figure Measurements: Precise NF characterization for receivers, amplifiers, and mixers, ensuring optimal signal integrity across RF and mm-Wave frequencies up to 40 GHz.
- System Validation: Testing of complete systems, including cables and interconnects, to verify performance for applications like 5G, radar, and satellite communications.
- Signal Generation and Analysis: Advanced signal generators and analyzers to evaluate system behavior under real-world conditions.
Our system-level testing services are designed to validate and optimize complex systems, ensuring reliability and performance for both research and commercial applications.
Frequently Asked Questions
How much does an S-parameter measurement cost?
Pricing is per device and depends on frequency: $150 up to 4.5 GHz, $250 up to 26.5 GHz, $350 up to 67 GHz, and $700 from 67 to 115 GHz with waveguide extenders. Setup fees may apply for power calibration and for 3- or 4-port measurements. Texas A&M researchers receive a 50% reduction.
How do you measure S-parameters?
We use vector network analyzers, with support for up to 4-port configurations. Measurements can include power calibration and P1dB for nonlinear evaluation. Results are delivered as Touchstone files.
What will I receive?
Touchstone files and spreadsheets containing the scattering parameter data, in formats suited to design validation and simulation import.
Do you measure noise figure?
Yes. Noise figure characterization is available for receivers, amplifiers and mixers up to 40 GHz, as part of our system-level testing.
Can you handle ITAR-controlled or export-controlled work?
Yes. iEMSL accepts ITAR-controlled projects under a Technology Control Plan, administered with the Texas A&M export control office. Tell us your control requirements when you request a quote, before shipping any samples.