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iEMSL

Intelligent Electromagnetic Sensor Laboratories at Texas A&M

Texas A&M University College of Engineering

S-Parameters and System-Level Testing

The Intelligent Electromagnetic Sensor Laboratories (iEMSL) at Texas A&M University provides high-precision S-parameter measurements, RF probing, and system-level testing for a diverse array of devices and systems, including amplifiers, attenuators, BJT/HBT, capacitors, CMOS, couplers, diplexers, duplexers, filters, GaAs HEMT, GaN HEMT, HEMT, inductors, interconnects, JFET, MESFET, mixers, MOSFET/LDMOS, NPN BJT, PIN diodes, splitters, step recovery diodes, transformers, varactors, and cables. Utilizing state-of-the-art vector network analyzers (VNAs) and advanced probing stations, our services cover frequencies from 300 kHz to mm-Wave, delivering critical data for research and industry applications in RF, microwave, and millimeter-wave technologies.

S-Parameter Measurements

The Intelligent Electromagnetic Sensor Laboratories (iEMSL) at Texas A&M University offers high-precision S-parameter measurements to characterize the performance of RF, microwave, and millimeter-wave components and systems. Utilizing state-of-the-art vector network analyzers (VNAs), our services cover frequencies from 300 kHz to 67 GHz, providing critical data for research and industry applications.

  • Comprehensive S-Parameter Analysis: Accurate measurement for passive and active components, including power calibration and P1dB measurement for nonlinear performance evaluation.
  • Multi-Port Configurations: Support for complex setups up to 4-ports to evaluate multi-port devices and interconnects with high accuracy.
  • Custom Test Protocols: Tailored measurement setups to meet specific project requirements, ensuring precise characterization for unique designs.
  • Detailed Reporting: Touchstone files and spreadsheets with scattering parameter data, delivered in formats suitable for design validation and optimization.

The pricing details provided below correspond to the cost per experiment or per Touchstone file, offering clear and adaptable options tailored to your testing requirements. Please note that setup fees may be applicable for advanced configurations, as well as for power calibration and measurements involving 3- or 4-port setups.

Frequency RangePrice/device
Keysight P9370A Network Analyzer300 kHz to 4.5 GHz$150 first + $50 additional
TAMU: $50 First+ $25 additional
Keysight N5242B PNA-X Network Analyzer 10 MHz to 26.5 GHz$250 first + $100 additional
TAMU: $150 First+ $50 additional
Rohde & Schwarz ZVA67 Vector Network Analyzer10 MHz to 67 GHz$450 first + $250 additional
TAMU: $300 First+ $150 additional

RF On-Wafer and Micro-Probing

Our advanced probing stations enable precise RF on-wafer and micro-probing measurements for a wide range of components, including filters, amplifiers, mixers, and integrated circuits. These capabilities ensure reliable performance evaluation for high-frequency electronics.

  • High-Resolution Probing: Probing stations for RF and microwave measurements on wafers, dies, and microelectronic components.
  • Custom Probing Solutions: Flexible setups to accommodate unique device geometries, ensuring accurate characterization for specialized applications.
  • High-Frequency Precision: Probing capabilities up to mm-Wave frequencies, ideal for cutting-edge semiconductor and RF component testing.
  • Frequency extenders: VDI WR10-VNAX (67 – 115GHz) and VDI WR6.5-VNAX (110 – 170GHz)

Our probing services support researchers and engineers in validating component performance, from initial design to final integration.


System-Level Testing

iEMSL provides comprehensive system-level testing for complete systems in communications, radar, and wireless applications. Conducted in our state-of-the-art Metrology labs, our services include noise figure (NF) measurements to optimize system performance.

  • Noise Figure Measurements: Precise NF characterization for receivers, amplifiers, and mixers, ensuring optimal signal integrity across RF and mm-Wave frequencies up to 40 GHz.
  • System Validation: Testing of complete systems, including cables and interconnects, to verify performance for applications like 5G, radar, and satellite communications.
  • Signal Generation and Analysis: Advanced signal generators and analyzers to evaluate system behavior under real-world conditions.

Our system-level testing services are designed to validate and optimize complex systems, ensuring reliability and performance for both research and commercial applications.

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Intelligent Electromagnetic Sensor Laboratories (iEMSL)
Texas A&M University

188 Bizzell St,
College Station, Texas, USA 77843

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