A high-sensitivity single-frequency method for low-loss thin dielectrics. Using the Keysight PNA-X Vector Network Analyzer with a QWED split post dielectric resonator, iEMSL measures dielectric constant and loss tangent at 10 GHz, including measurements up to 100 °C. In collaboration with QWED.
10 GHz
Single frequency
±2×10⁻⁵
tanδ resolution
To 100 °C
Temperature option
5 business days
Standard turnaround
Why the SPDR
Ultra-high sensitivity
Loss tangent resolution to ±2×10⁻⁵, ideal for extremely low-loss ceramics and specialized polymers used in high-Q structures.
Film-on-substrate
Extracts a coating’s properties from the shift in resonant frequency and Q-factor between the bare and coated substrate.
Thin sheets and films
Characterizes free-standing dielectric sheets and thin films at a precise single frequency.
High temperature
The only iEMSL standard method offered up to 100 °C, supporting IPC 2.5.5.15 and IEC 61189-2-721.
Film-on-substrate measurement
We extract a coating’s properties by measuring the bare substrate first to set a baseline, then the coated substrate, and tracking the shift in resonant frequency and Q-factor. Send a bare reference piece of the same substrate, from the same lot, alongside your coated sample. Without the reference, the film and substrate cannot be separated.
Technical specifications
| Frequency | 10 GHz (single frequency) |
| Dielectric constant | Δε/ε = ±(0.0015 + Δh/h) |
| Loss tangent | ±2×10⁻⁵ or ±0.03 × tanδ |
| Temperature | Room temperature to 100 °C |
| Standards | IPC 2.5.5.15, IEC 61189-2-721 |
Sample requirements
Lateral size: 45-90 mm (circular or square)
Thickness: 15 μm – 0.95 mm
Form: planar, with clean edges
For film-on-substrate work, include a bare reference of the same substrate from the same lot.
What to send us
- One planar sample per measurement, 45-90 mm (circular or square), 15 μm – 0.95 mm thick
- For film-on-substrate: a bare substrate reference of the same lot
- Whether high-temperature data (to 100 °C) is required
Pricing
$300 first sample
Plus $200 per additional sample. High-temperature measurement up to 100 °C is $500 per sample. Standard turnaround 5 business days, with rush service available.
Texas A&M researchers receive 50% off listed prices.
What you receive
- Extracted Dk and Df
- Tables versus temperature, where applicable
- Raw data (CSV) including resonance and Q data on request
- Technical report on request (additional charge)
View our example measurements. See also: WR-90, FPOR, custom characterization, all material characterization services.
Frequently Asked Questions
What do I send for a film-on-substrate measurement?
Send the coated sample plus a bare reference piece of the same substrate from the same lot. We measure the bare substrate first to set a baseline, then the coated sample, and extract the film from the shift in resonant frequency and Q-factor. Without the reference, the film and substrate cannot be separated.
Can you measure at high temperature?
Yes, the SPDR is the only iEMSL standard method offered up to 100 °C, priced at $500 per sample.
Is the SPDR single-frequency?
Yes, it measures at 10 GHz. If you need data across a frequency band, use the FPOR (10.2-52.2 GHz).
What sample size and thickness do you need?
A planar sample 45-90 mm across (circular or square), 15 μm to 0.95 mm thick, with clean edges.
How low a loss tangent can you resolve?
Loss tangent resolution is ±2×10⁻⁵ (or ±0.03 × tanδ, whichever is greater), among the most sensitive methods available for low-loss thin dielectrics.
Can you handle ITAR-controlled or export-controlled work?
Yes. iEMSL accepts ITAR-controlled projects under a Technology Control Plan, administered with the Texas A&M export control office. Tell us your control requirements when you request a quote, before shipping any samples.
Ready to characterize your thin film?
From low-loss substrates to coated films, get sensitive 10 GHz data.