For the use of probing stations, users have to bring their own probes and calibration substrates for measurements.
For any measurements higher than 18 GHz, users have to bring their own cables and adapters.
Product Description:
150 mm manual probing solution for mm-Wave, THz and load pull applications. This enables precise probe placement on pads as small as 25 µm x 35 µm with 1 µm contact repeatability. Support frequency ranges up to 67 GHz.
Available as a measurement service. This probing station is used for iEMSL’s on-wafer and micro-probing work. See S-parameter and system-level testing for supported devices and pricing.